A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...
What is Electrostatic Force Microscopy? Electrostatic Force Microscopy (EFM) is a scanning probe microscopy technique that measures the electrostatic interactions between a conductive probe and a ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...
The word “piezo” derives from the Greek word piezein, meaning “to press tightly”. Piezoelectricity refers to a material’s ability to convert mechanical energy (pressing) into electric energy ...
An atomic force microscope tip writes data in stable ferroelectric structures, enabling reliable multistate storage at ...
Researchers at Oak Ridge National Laboratory used specialized tools to study materials at the atomic scale and analyze ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
A technical paper titled “Dynamically tuning friction at the graphene interface using the field effect” was published by researchers at University of Illinois Urbana-Champaign and University of ...
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